WebMoreover, Al 2 O 3/ZrO 2 showed a higher permittivity, hysteresis, and breakdown field than Al 2 O 3/HfO 2. Show less Other authors. See publication. Comparison of the interface and border traps of nanolaminate and bilayer structures of Al2O3 and HfO2 on In0.53Ga0.47As ... A small amount of Al doping into the HfO2 film can stabilize the ... WebWith this ultra-high permittivity, our Al-doped HfO 2 near MPB films deposited at 270 °C with a physical thickness of 9.4 nm exhibit an ultra-low leakage current density of 1.5×10 −5 A/cm 2 at 1 V with an extremely small equivalent oxide thickness of 0.53 nm.
Relative Permittivity - the Dielectric Constant
WebNov 4, 2024 · By adoption of a high permittivity ZrO2 capping layer (ZOCL), enhanced ferroelectric properties were achieved in the Hf 0.5Zr0.5O2 (HZO) thin films, demonstrating that ZOCL is very favorable for high performance ferro electric HZO films and their future device applications. 1 View 5 excerpts, cites background WebAug 18, 2014 · Si-doped HfO 2 has been widely studied because of its high permittivity, compatibility with silicon substrate, and low leakage current. 1 Recent studies have also shown that Si-doped HfO 2 thin... th-42px6u
RIT Scholar Works Rochester Institute of Technology Research
WebJan 15, 2024 · In view of the extensive use of hexagonal boron nitride (hBN) in 2D material electronics, it becomes important to refine its dielectric characterization in terms of low … WebDec 22, 2005 · The adiabatic electron affinity of HfO2 was determined to be 2.14 +/- 0.03 eV, and that of ZrO2 was determined to be 1.64 +/- 0.03 eV. Concurrently, advanced electronic structure calculations were conducted to determine electron affinities, vibrational frequencies, and geometries of these systems. WebJul 26, 2024 · Abstract: This paper presents the piezoelectric properties of silicon doped hafnium oxide (Si:HfO2) thin films and their superior suitability for energy harvesting applications. Various layer thicknesses from 10 nm to 50 nm, executed as single layer and in a laminate structure, are investigated. th 42px7a